Ключевые слова: power equipment, FCL inductive, dc performance, HTS, YBCO, thin films, experimental results, current limiting characteristics, FCL flux-coupling
Huhtinen H., Golmar F., Acha C., Sanca G.A., Barella M., Alurralde M., Marlasca F.G., Paturie P., Levy P.
Ключевые слова: calorimetric method, cryogenic systems, refrigerator, shielding effects, LTS, NbTi, films, laminations, HTS, YBCO, thin films, cooling technology, coils
Ключевые слова: HTS, YBCO, thin films, microwave devices, impedance, measurement technique, substrate sapphire, meander
Ключевые слова: thin films, PLD process, substrate SrTiO3, GdBCO, coated conductors, IBAD process, ion irradiation, irradiation effects, defects columnar, microstructure, critical caracteristics, critical current, angular dependence, anisotropy, critical current density, n-value, magnetic field dependence, X-ray diffraction, experimental results, HTS, YBCO
Ключевые слова: HTS, Bi2212, thin films, nanodoping, nanoscaled effects, nanoparticles, fabrication, sol gel process, texture, X-ray diffraction, microstructure, grain size, resistivity, resistive transition, critical temperature, critical caracteristics, Jc/B curves, critical current density, composition, pinning force, temperature dependence, experimental results
Ключевые слова: chalcogenide, FeSeTe, coated conductors, PLD process, IBAD process, RABITS process, substrate Hastelloy, template layers, thin films, substrate single crystal, comparison, X-ray diffraction, lattice parameter, resistive transition, magnetization, temperature dependence, critical caracteristics, Jc/B curves, microstructure, fabrication, experimental results
Ключевые слова: YBCO, thin films, fabrication, spin coating process, substrate Si, Raman spectroscopy
Ключевые слова: HTS, YBCO, thin films, new, fabrication, electron beam evaporation, pulsed operation, targets, density, microstructure, substrate Si, experimental results
Ключевые слова: chalcogenide, thin films, coated conductors, fabrication, substrate metallic, PLD process, review, IBAD process, buffer layers, critical caracteristics, Jc/B curves, critical current density, angular dependence, anisotropy, X-ray diffraction, resistivity, temperature dependence, magnetic field dependence, upper critical fields, irreversibility fields, pinning force, microstructure, experimental results
Ключевые слова: HTS, YBCO, thin films, PVD process, fabrication, targets, microstructure
Ключевые слова: LTS, thin films, PLD process, X-ray diffraction
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